The probability of systematic and random faults in electronic systems is increasing due to growing complexity, sensitivity to soft-errors, internal coupling effects and external disturbances. If we define robustness as the ability to continue mission reliably despite the existence of faults, we can conclude that modern electronic systems are increasingly less robust.

Nowadays, deep-sub micron technologies and multi-CPU systems are used in high-volume applications where safety is a key factor. For example, in the automotive industry, electronic systems are involved in airbags, active brakes, engine control and future x-by-wire cars. The same goes for biomedics and aerospace. But it is not only a matter of safety: availability also becomes relevant for high-demanding and very high-volume applications such as modern communications systems.

In such a scenario, the need for tools, methodologies and architectures is more important than ever to manage robustness and related costs.